K, P.; A, R. IoT Assisted Multimodal Deep Learning Framework for Real-Time Onion Spoilage Detection. International Research Journal of Multidisciplinary Technovation, [S. l.], v. 8, n. 6, p. 117–136, 2026. DOI: 10.54392/irjmt2666. Disponível em: https://journals.asianresassoc.org/index.php/irjmt/article/view/7268. Acesso em: 3 nov. 2026.