SACHAN, R. K.; VEDVRAT; BAJPAI, S. Temperature Sensitivity Assessment of Nonlinear Channel Tunnel Field-Effect Transistor for Raised Efficiency and Reliability in Nanoscale Electronics. International Research Journal of Multidisciplinary Technovation, [S. l.], v. 7, n. 2, p. 261–276, 2025. DOI: 10.54392/irjmt25218. Disponível em: https://journals.asianresassoc.org/index.php/irjmt/article/view/3264. Acesso em: 8 may. 2026.